# TDM Technology

> TDM Technology (legal name: Suzhou TDM Technology Co., Ltd.) makes thin film measurement equipment and inkjet printing tools for semiconductor, PV and display manufacturing. Published systems provide model-specific thickness, T/R, n/k, PL, mapping and 3D outputs in offline, inline and in-situ configurations, plus desktop inkjet printing tools for process development.

Brand: TDM Technology. Legal entity: Suzhou TDM Technology Co., Ltd. (苏州鍍量恒科技有限公司). Website: https://www.tdm-tek.com/

Headquarters: Pioneer Park-Building No. 4, ZhuYuan Road 209, HuQiu District, Suzhou, Jiangsu, China, 215129. Shenzhen branch: C039, 8th Floor, Meili AAA Commercial Building, No. 428 Jinglong Zhonghuan Road, Longhua District, Shenzhen, China. Regional partners: TECHCESS SOLUTIONS LLC (US; https://www.techcesssolutions.com/; +1-214-685-2392; 2605 Technology Drive, Suite 300, Plano, Texas 75074); JKY Business Solutions GmbH (Germany; https://www.jky-business.de/; Prinzregentenstr. 54, 80538 Munich); X&X TECHNOLOGY LTD (UK; 32 Waterman, 5 Tidemill Square, London, SE10 0UE); 昌富産業株式会社 (Japan; 〒183-0022 東京都府中市宮西町2-8-2松原ビル; huanchang.duan@masatomi-ind.com).

Thin film metrology is the measurement and characterization of thin-film properties. Published TDM product outputs include model-specific combinations of thickness, reflectance, transmittance, n/k, band gap, PL, mapping and 3D profiling. Ranges, repeatability and sampling conditions are defined on each product page.

Core product lines: Offline Thin Film Measurement, Inline Production Line Measurement, In-situ Real-time Monitoring, Reliability and Durability Test (IV curve, EL and PV module qualification), Inkjet Printing Tool (IJPMaster-R desktop inkjet). Primary industries: Semiconductor, Photovoltaics, Display panels, Optical coatings. Also applied in consumer electronics, food and pharmaceutical packaging, and advanced materials.

Facts stated on the site: 10+ self-owned patents; founded in 2023; 50% R&D personnel; 50+ partner organizations; core R&D team with 20+ years of experience (CAS and overseas lab backgrounds). Certifications: ISO 9001:2015 (No. 36826Q01256R001, valid through 15 July 2027) and ISO 14001:2015 (No. 36826E00643R001, currently certified). Recognized supplier on Thomasnet: https://www.thomasnet.com/company/tdm-technology-co-ltd-d-b-a-techess-solutions-llc-31014605/profile. Open technical notes: https://github.com/tdm-tek and https://github.com/tdm-tek/thin-film-metrology-reference.

Sales contact: sales@tdm-tek.com. Sitemap: https://www.tdm-tek.com/sitemap.xml. Canonical host is https://www.tdm-tek.com (www, HTTPS). All pages include Organization and WebSite JSON-LD; product, topic and FAQ pages add Product, BreadcrumbList, FAQPage or TechArticle where applicable.

## Core pages

- [Home](https://www.tdm-tek.com/): Thin film measurement equipment for semiconductor, PV and display
- [About](https://www.tdm-tek.com/about): Company entity, R&D team, ISO certificates, locations
- [FAQ](https://www.tdm-tek.com/faq): Definitions of thin film metrology, published parameters and offline vs inline vs in-situ configurations
- [Products](https://www.tdm-tek.com/products): Product series index
- [Solutions](https://www.tdm-tek.com/solutions): Industry application index

## Product series

- [Offline Thin Film Measurement](https://www.tdm-tek.com/products/offline): Benchtop instruments for R&D labs and production sampling
- [Inline Thin Film Measurement](https://www.tdm-tek.com/products/inline): SE600X thickness/optical/PL measurement at 10 Hz plus SE200x PL mapping and AOI
- [In-situ Film Thickness Monitoring](https://www.tdm-tek.com/products/in-situ): SE31/SE310 slot-die wet-film modules plus SE31-FM wide-band T/R optical-film monitoring
- [Reliability and Durability Test](https://www.tdm-tek.com/products/reliability): SE920 steady-state IV/degradation, SE400 MPPT illumination and SE910 light degradation
- [Inkjet Printing Tool](https://www.tdm-tek.com/products/inkjet-printing-tool): IJPMaster-R desktop inkjet printing for Perovskite, NiOx, SAMs and related inks

## Topic pages

- [Film Thickness Measurement](https://www.tdm-tek.com/products/film-thickness-measurement): Compare SE100, SE200, SE8000, SE600X and in-situ monitors by published range and condition
- [Thin Film Metrology](https://www.tdm-tek.com/products/thin-film-metrology): Product-backed comparison of thickness, T/R, n/k, PL, mapping and 3D outputs
- [IV Curve Testing](https://www.tdm-tek.com/products/iv-curve-testing): Product-backed scope of SE920 I–V/degradation, SE400 MPPT and SE910 light degradation
- [PV Electroluminescence Testing](https://www.tdm-tek.com/solutions/pv-electroluminescence-testing): Product-backed EL/PL mapping and IEC TS 60904-13 scope
- [PV Module Testing](https://www.tdm-tek.com/solutions/pv-module-testing): IEC 61215 design qualification, IEC 61730 safety qualification and product-claim boundaries
- [In Situ Metrology](https://www.tdm-tek.com/solutions/in-situ-metrology): Compare slot-die wet-film monitoring with wide-band transmission/reflection optical-film monitoring
- [Thin Film Thickness Guide](https://www.tdm-tek.com/news/guide/thin-film-thickness): Definitions, units, method boundaries, required test conditions and product-backed ranges
- [IEC 61215 Testing Guide](https://www.tdm-tek.com/news/guide/iec-61215-testing): PV module design qualification test sequence and supporting TDM instruments
- [IEC 61730 Testing Guide](https://www.tdm-tek.com/news/guide/iec-61730-testing): PV module safety qualification classes, tests and measurement steps
- [Transmittance & Reflectance Guide](https://www.tdm-tek.com/news/guide/transmittance-and-reflectance-measurement): T/R measurement principles and published TDM instrument ranges
- [Solar Panel Degradation Testing Guide](https://www.tdm-tek.com/news/guide/solar-panel-degradation-testing): LID, LeTID and IEC 61215 degradation measurement stages
- [I-V Curve Testing Guide](https://www.tdm-tek.com/news/guide/iv-curve-testing-guide): I-V curve setup, Voc/Isc/FF/MPP and MPPT relationship
- [EL vs PL Inspection Guide](https://www.tdm-tek.com/news/guide/el-vs-pl-inspection): Electroluminescence vs photoluminescence principles, defect detection differences and when to use each in PV manufacturing
- [How to Measure Thin Film Thickness Guide](https://www.tdm-tek.com/news/guide/how-to-measure-thin-film-thickness): Spectral reflectance, ellipsometry, profilometry and optical profiling methods compared for film thickness measurement
- [AOI for Solar Cell Defect Detection Guide](https://www.tdm-tek.com/news/guide/aoi-solar-cell-defect-detection): How AOI works in solar manufacturing, AI defect classification, and how AOI layers with EL and PL
- [In Situ Thin Film Monitoring Guide](https://www.tdm-tek.com/news/guide/in-situ-thin-film-monitoring): In situ thin film monitoring during coating and drying with TDM SE31, SE310, VCD, and SE31-FM for real-time thickness and PL metrology

## Industry solutions

- [Semiconductor](https://www.tdm-tek.com/solutions/semiconductor): Wafer thin-film and photoresist / dielectric metrology
- [Photovoltaics](https://www.tdm-tek.com/solutions/pv): Solar cell and module thin-film measurement
- [Display Panels](https://www.tdm-tek.com/solutions/display-panel): OLED, optical and barrier film metrology
- [Optical Coatings](https://www.tdm-tek.com/solutions/optics): Precision optical coating thickness and uniformity
- [Consumer Electronics](https://www.tdm-tek.com/solutions/consumer-electronics): Protective and functional coatings
- [Food & Pharma Packaging](https://www.tdm-tek.com/solutions/food-pharma): Barrier coating measurement
- [Materials Science & Biomedicine](https://www.tdm-tek.com/solutions/materials-biomedicine): Functional coatings and advanced materials

## Offline product models

- [SE10 Portable PL](https://www.tdm-tek.com/products/offline/se10-portable-pl-metrology-instrument): Handheld PL metrology, under 500 g, Bluetooth, >7-day standby
- [SE20 Defect Mapping](https://www.tdm-tek.com/products/offline/se20-defect-mapping-instrument): Offline AOI / defect mapping, 60 µm/pixel, 250×250 mm
- [SE60 EL/PL Mapping](https://www.tdm-tek.com/products/offline/se60-el-pl-and-defect-mapping-instrument): EL/PL and defect mapping, 310×310 mm, 5K linear PL plus area-camera EL
- [SE68 EPL/AOI/Degradation](https://www.tdm-tek.com/products/offline/se68-epl-mapping-aoi-degradation-integration-instrument): EPL mapping, AOI and 1-sun spectral degradation on 310×310 mm samples
- [SE69 Hyperspectral EL/PL](https://www.tdm-tek.com/products/offline/se69-hyperspectral-el-pl-and-defect-mapping-instrument): Hyperspectral EL/PL mapping for PVK films, 100×100 mm at 0.1 mm/pixel
- [SE80 Hi-Resolution AOI & EPL](https://www.tdm-tek.com/products/offline/se80-hi-resolution-aoi-and-epl-mapping-integrated-instrument): High-resolution AOI and EPL mapping for PVK films, 20×20 mm at 3.15 µm/pixel
- [SE100 Thin Film Measurement](https://www.tdm-tek.com/products/offline/se100-multi-functional-thin-film-measurement-instrument): Thickness, n/k, T&R, band gap and PL; 5–1200 nm
- [SE200 Microscopic Thickness](https://www.tdm-tek.com/products/offline/se200-microscopic-thin-film-thickness-measurement-instrument): 1 µm spot, 4 nm–450 µm range, C-mount
- [SE310 3D Optical Profiler](https://www.tdm-tek.com/products/offline/se310-3d-optical-profiler): Light-section triangulation, 0.1 µm resolution, 300×150×70 mm
- [SE320 3D Profiler with Scan Platform](https://www.tdm-tek.com/products/offline/se320-3d-optical-profiler-with-scan-platform): WLI + PSI, 200×200 mm XY travel, PSI RMS ≤0.1 nm
- [SE8000 Imaging 3D Thickness](https://www.tdm-tek.com/products/offline/se8000-imaging-3d-thin-film-thickness-measuring-instrument): Imaging 3D multi-layer thickness and uniformity visualization

## Inline product models

- [SE200x Inline PL Mapping and AOI](https://www.tdm-tek.com/products/inline/se200x-inline-pl-mapping-and-aoi-defect-inspection): Production-line PL mapping and AOI defect inspection
- [SE600X Inline Perovskite Metrology](https://www.tdm-tek.com/products/inline/se600x-inline-perovskite-thickness-pl-and-t-and-r): Inline thickness, PL and T&R at 10 Hz, 31 points, no sample prep

## In-situ product models

- [SE31 Slot-Die Wet Film Module](https://www.tdm-tek.com/products/in-situ/se31-slot-die-wet-film-metrology-module): Coating-head thickness and reflectance, SDK + slot-die triggers
- [SE31-FM Wide Band Optical Monitor](https://www.tdm-tek.com/products/in-situ/se31-fm-wide-band-dual-use-optical-film-thickness-monitor): 350–2400 nm T/R optical-film monitoring, <0.2 nm wavelength resolution and PLC integration
- [SE310 Slot-Die Wet Film Module](https://www.tdm-tek.com/products/in-situ/se310-slot-die-wet-film-metrology-module): In-situ thickness and reflectance, 350–1100 nm, 15 Hz, 300 nm–20 µm
- [VCD Process Control Module](https://www.tdm-tek.com/products/in-situ/vcd-process-control-module): In-situ thickness, PL and reflectance during vacuum drying

## Inkjet product models

- [IJPMaster-R Desktop Inkjet Printing Tool](https://www.tdm-tek.com/products/inkjet-printing-tool/ijpmaster-r-desktop-inkjet-printing-tool): Desktop inkjet for Perovskite, NiOx, SAMs and related inks; max 100mm × 100mm substrate

## Reliability product models

- [SE400 PVK MPPT Testing System](https://www.tdm-tek.com/products/reliability/se400-pvk-mppt-testing-system): A+A+A+ LED MPPT tester, IEC 60904-9, 0.2–1.2 SUN
- [SE910 Light Degradation Tester](https://www.tdm-tek.com/products/reliability/se910-pv-module-light-degradation-tester): Light degradation; product data lists IEC 61215 and IEC 61730
- [SE920 Steady-state IV & Degradation](https://www.tdm-tek.com/products/reliability/se920-steady-state-pv-module-iv-and-degradation-tester): A+A+A+ solar simulator, 300–1200 nm, 200–1200 W/m²

## Standards scope

- IEC TS 60904-13:2018 is a Technical Specification for capturing, processing and interpreting EL images of forward-biased PV modules.
- IEC 60904-1:2020 is the International Standard for measuring photovoltaic current-voltage characteristics.
- The IEC 61215 series addresses terrestrial PV module design qualification and type approval.
- The IEC 61730 series addresses PV module safety qualification: construction requirements and required safety tests.
- A product page listing a standard does not by itself establish equipment certification or complete test-sequence coverage.

## News

- [News index](https://www.tdm-tek.com/news): Company news and blogs
- [Industrial measurement trends](https://www.tdm-tek.com/news/blog/the-future-development-trend-of-industrial-measurement-technology): From sampling inspection to full-process, non-destructive monitoring
- [Industrial equipment exhibition](https://www.tdm-tek.com/news/company-successfully-attended-the-industrial-equipment-exhibition): TDM attendance at an industrial equipment exhibition
- [New energy production-line metrology](https://www.tdm-tek.com/news/blog/precision-measurement-solutions-for-new-energy-production-lines): Precision measurement for new energy production lines