TDM TECHNOLOGY CO.,LTD.
Another Milestone: TDM Technologies Delivers EL/PL&Defect Mapping Instrument to Leading Enterprise
TDM Technologies | May 22, 2025
Recently, Shenzhen TDM Technologies Co., Ltd. (hereinafter referred to as "TDM") successfully delivered another SE60 EL/PL&Defect Mapping Instrument. This milestone not only solidifies TDM's technological leadership in perovskite material analysis but also demonstrates its commitment to providing robust technical support for perovskite research and applications.
Perovskite materials, with their outstanding optoelectronic properties, hold immense potential in solar cells, LEDs, and other fields. However, defect analysis remains a critical challenge hindering their commercialization. The SE60 EL/PL&Defect Mapping Instrument was developed precisely to address this industry pain point.
Key Features of the SE60 System:
1. Industry First: The world's first EL/PL&Defect Mapping Instrument for perovskites, combining multiple advanced technologies to deliver a groundbreaking solution.
2. Patented Technology: Capable of EL mapping and PL mapping tests, with deep integration of AI algorithms for automated, high-precision analysis of defects such as absorber layer quality, electrode integrity, laser scribing precision, and short-circuit points.
3. Ultra-Detailed Imaging: Unique lighting and camera design ensures high-resolution imaging, capturing even the subtlest data for unparalleled accuracy.
4. Expert Support: Beyond imaging, TDM provides data-driven recommendations to enhance R&D and production decisions.
Recommended Application:
During product aging tests, multiple small cells can be placed in the SE60 simultaneously, enabling efficient PL mapping comparisons under identical conditions to evaluate process variations.
The delivery of the SE60 EL/PL&Defect Mapping Instrument underscores TDM’s technical expertise and customer-centric responsiveness in perovskite material analysis. Moving forward, TDM will continue to innovate, providing efficient, precise analytical tools to accelerate the commercialization of perovskite technology.
1. Industry First: The world's first EL/PL&Defect Mapping Instrument for perovskites, combining multiple advanced technologies to deliver a groundbreaking solution.
2. Patented Technology: Capable of EL mapping and PL mapping tests, with deep integration of AI algorithms for automated, high-precision analysis of defects such as absorber layer quality, electrode integrity, laser scribing precision, and short-circuit points.
3. Ultra-Detailed Imaging: Unique lighting and camera design ensures high-resolution imaging, capturing even the subtlest data for unparalleled accuracy.
4. Expert Support: Beyond imaging, TDM provides data-driven recommendations to enhance R&D and production decisions.
Recommended Application:
During product aging tests, multiple small cells can be placed in the SE60 simultaneously, enabling efficient PL mapping comparisons under identical conditions to evaluate process variations.
The delivery of the SE60 EL/PL&Defect Mapping Instrument underscores TDM’s technical expertise and customer-centric responsiveness in perovskite material analysis. Moving forward, TDM will continue to innovate, providing efficient, precise analytical tools to accelerate the commercialization of perovskite technology.
Shenzhen TDM Technology Co., Ltd.
8th Floor, Unit C039, Meili AAA Commercial Building, No. 428 Jinglong Zhonghuan Road, Longyuan Community, Longhua Street, Longhua District, Shenzhen, China, 518109.
Suzhou TDM Technology Co., Ltd.
Pioneer Park-Building No. 4, ZhuYuan Road 209, HuQiu District, Suzhou, Jiangsu Province, China, 215129.
E-mail：charlie@tdm-tek.com
Wechat
