TDM TECHNOLOGY CO.,LTD.
Groundbreaking Measurement Technology
First-Principles Physics Meets Smart Algorithms
Leveraging first-principles physics and full-spectrum optical analysis, our patented algorithms solve perovskite measurement challenges that conventional tools cannot address
SE100
The Industry’s First Multi-functional Perovskite Measurement Instrument SE101
Thin Film Spectrum Measurement Instrument
SE60
EL/PL&Defect Mapping Instrument SE68
High Resolution EL/PL&Defect Mapping Instrument
SE20
Large Area Defect Mapping Instrument SE21
High Resolution Defect Mapping Instrument
SE10
Portable PL Metrology