TDM TECHNOLOGY CO.,LTD.
High Resolution EL/PL&Defect Mapping Instrumen SE68
To empower universities, research institutes, and laboratories with deeper insights into perovskite crystallization, we proudly present the
SE68--a cutting-edge, all-in-one high-resolution EPL mapping system .
Why SE68?
Unmatched Resolution: Capture ultra-detailed crystallization data
Market-First Innovation: Fills a critical gap in perovskite research tools
All-in-One Solution: Streamlined workflow for efficient analysis
Powerful Research Companion: Accelerates discoveries with precise, comprehensive data
Elevate your perovskite studies with SE68—where advanced technology meets groundbreaking research!
Key Features
Hyperspectral Camera
Large Detection Area
100×100mm full-sample coverage
Comprehensive Mapping
Simultaneous PL intensity, FWHM & bandgap mapping
Dynamic Tracking
Time-resolved PL evolution
monitoring
Multi-Mode Detection
EL mapping & BL mapping capabilities