TDM TECHNOLOGY CO.,LTD.
The Industry’s First Multi-functional Perovskite Measurement Instrument SE100
The SE100 is the industry’s first system capable of simultaneously measuring multiple critical parameters of perovskite films, including
Thickness Photoluminescence(PL) Reflectance &Transmittance Refractive Index (n) & Extinction Coefficient (k) Bandgap
Unmatched Capabilities
Unlike conventional tools such as ellipsometers, thickness measurement systems, or profilometers, the SE100 can accurately measure:
· Perovskite layers on textured (rough) substrates
· Films doped with lead iodide (PbI₂)
Powered by proprietary algorithms, the SE100 sets a new standard for comprehensive and precise perovskite characterization.
Key Features Demonstration
1. Unlike contact profilometers that require sample preparation and cause surface damage, SE100's optical measurement technology enables:
✓ Direct inline testing - Measure samples straight from production
✓ Zero sample damage - Preserve valuable materials and devices
✓ Instant results - No cutting, coating or special prep needed
Why This Matters for Production：
Eliminates yield loss from destructive testing
Cuts measurement preparation time by >90%
Enables true in-process quality control
2. Unlike traditional thickness measurement tools like ellipsometers or profilometers, the SE100 eliminates the need for pre-input refractive index (n, k) values—which can be unstable due to ongoing industry optimization of perovskite compositions. Instead, it dynamically calculates and outputs n, k values during measurement, delivering fast and reliable thickness results even as perovskite formulations are adjusted.
PbI₂ film on TCO
3. Accurate thickness measurement of textured perovskite substrates and PbI₂-doped films has long been an industry challenge. The SE100 breaks through these limitations with its innovative algorithm, delivering reliable measurements that accelerate perovskite commercialization.
SE100: 221.99 nm V.S. SEM： 220.5 nm PbI₂ film on textured silicon
SE100：176.6 nm V.S. SEM： 164.1 nm
4. Photoluminescence (PL) measurements provide critical insights into perovskite crystallization processes and material composition, enabling precise optimization of your photovoltaic devices.
5. Frequently Asked Question: "How does SE100's accuracy compare to ellipsometers, thickness measurement systems, and profilometers?"
Our Validation:
We conducted comparative testing with nearly 50 client samples (NiO ₓ , C₆₀, SnO ₓ ) against these industry-standard instruments. The data confirms SE100 delivers equivalent measurement accuracy
Shenzhen TDM Technology Co., Ltd.

8th Floor, Unit C039, Meili AAA Commercial Building, No. 428 Jinglong Zhonghuan Road, Longyuan Community, Longhua Street, Longhua District, Shenzhen, China, 518109.
Suzhou TDM Technology Co., Ltd.

Pioneer Park-Building No. 4, ZhuYuan Road 209, HuQiu District, Suzhou, Jiangsu Province, China, 215129.

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