TDM TECHNOLOGY CO.,LTD.
Thin Film Spectrum Measurement Instrument SE101
Derived from SE100's
proven platform
Focused on rapid thin-
film characterization:
Transmission
Reflection
Absorption spectra
Optimized for:
Perovskite materials
Other functional films
Cost-effective
investment
Key Advantage
We've removed the complexity while keeping the core functionality you actually need - delivering faster results at a lower entry price