TDM Technologies' Measurement Equipment Rapidly Deploys in Yangzhou, Facilitating Strategic Collaboration Between Global Perovskite Giants
TDM Technologies | June 14, 2025
Recently, TDM (TDM) Technologies' technical personnel and measurement equipment swiftly arrived in Yangzhou to support the strategic collaboration between two leading global perovskite companies.
In late May this year, a world-leading thin-film solar enterprise formally requested TDM Technologies to provide an SE100 film thickness measurement instrument and an SE60 large-area PL/EL measurement device within one week, along with deploying technical personnel to assist in a cooperative project between the company and a top-tier domestic perovskite equipment manufacturer.
With tight deadlines and demanding tasks, upon receiving the client's request, TDM urgently coordinated internal and external resources. Within two days, both equipment and personnel were simultaneously deployed to a leading perovskite equipment manufacturer in Yangzhou. Working closely with the manufacturer's production team, they successfully completed equipment matching and verification before the overseas team's arrival. During the implementation phase of the project, TDM's patented SE100 product conducted rapid thickness characterization and PL sampling measurements on all produced 600 mm x 1200 mm modules, covering layers such as FTO, NiOx, perovskite, and C60. The measurement data provided by TDM's equipment offered timely feedback for the overseas client's large-scale module production experiments, with precise and reliable data earning high praise from technical personnel and expert leaders on both sides. This effectively ensured the efficient progress of the collaborative project.
Based on the validity of offline data, the overseas client sought to further explore the SE100's measurement capabilities and requested the temporary setup of an inline real-time monitoring solution. TDM Technologies and the Yangzhou equipment manufacturer collaborated closely to complete the on-site deployment of the inline equipment within just two days, enabling real-time monitoring of thickness and film formation quality for dry and semi-dry perovskite films. Innovative methods were also employed to achieve inline monitoring of ultra-thin layers such as NiOx and C60.
Within the next week, TDM's EL and PL mapping equipment (SE60) will also be successfully installed to assist the client in monitoring crystallization uniformity, laser scribing, and module uniformity.
As an emerging force in the industry, TDM Technologies has gained profound insights into the advancements of leading global perovskite enterprises through this collaboration. Moving forward, the company remains committed to learning humbly from domestic and international industry leaders, striving to contribute to the measurement needs of the perovskite photovoltaic industry.