TDM TECHNOLOGY CO.,LTD.
TDM’s Full-Line Metrology Solution Validated – U.S. Client Places Two Additional Orders Within Three Weeks TDM Technologies | June 30, 2025
On June 28, TDM Technology successfully concluded its collaborative project with a global photovoltaic industry leader. Over the three-week project period, TDM’s breakthrough perovskite mass-production line integrated inline metrology solution underwent rigorous validation by the U.S. client, earning high praise for its performance.


The client confirmed that TDM’s solution delivered exceptional accuracy, rapid sampling, and high repeatability, with its custom-designed physical models and industry-unique approach tailored specifically for perovskite applications. Impressed by the results, the client immediately placed two additional service orders on-site—expanding the original equipment and service agreement—to jointly complete full-line measurement validation. The collaboration has laid the groundwork for long-term future partnerships.

During the project, TDM’s technical team demonstrated
end-to-end thickness measurement (from transparent conductive glass to back-electrode thin-film structures), real-time monitoring of thickness & PL intensity , and large-area uniformity scanning, addressing critical client challenges such as:
· Film layer inhomogeneity
· Absorption layer quality control
· Laser process stability optimization
· Semiconductor consumables quality management

"The industrialization of perovskite solar cells remains a challenging journey," acknowledged TDM. "We sincerely appreciate our U.S. partner's trust and will continue refining our technologies to deliver unique contributions to perovskite mass production ."