TDM's Inline Measurement Solution Successfully Shipped to U.S. Client

TDM Technologies | Dec 25, 2025

At present, the global perovskite photovoltaic industry is entering a critical phase of large-scale expansion. With the advancement of "carbon neutrality" goals in various countries, perovskite cells, as the most promising next-generation photovoltaic technology, are attracting significant attention in their industrialization process. However, to achieve the large-scale commercialization of perovskite photovoltaics, precise control over manufacturing processes has become a crucial technical hurdle that must be overcome. In this context, production line construction and process optimization have emerged as focal points of industry competition.

1

Pain Point Highlighted: Film Quality Determines Battery Performance

The core of perovskite solar cells lies in the quality of their thin films. The uniformity, density, and precise thickness control of perovskite films directly determine the generation and transport efficiency of photo-induced carriers, thereby affecting the conversion efficiency and stability of the cells.
However, traditional film thickness measurement methods are mostly offline sampling techniques, which are not only inefficient but also fail to comprehensively reflect the quality of entire perovskite films.
Common shortcomings of traditional methods such as ellipsometry and profilometry include destructive measurements, offline sampling, and inefficiency. Like "the blind men and the elephant," these methods cannot provide comprehensive and timely feedback for production processes, making them a critical bottleneck limiting the improvement of production line yield.

2

Technological Breakthrough: inline Nanometer-Level Precision Detection

In response to this industry challenge, TDM Thin Film Technology Co., Ltd., guided by first-principles thinking, has driven innovation through collaboration with seasoned physicists and academic research institutions to revolutionize thin-film coating measurement technology. The company has successfully developed an inline film thickness metrology system for perovskite full-film stacks, providing a groundbreaking solution for process monitoring and enhancement in perovskite production lines.

This system enables in-situ, real-time, non-contact measurement of perovskite thin-film photovoltaic layer thickness with nanometer-level precision, akin to equipping the production line with "X-ray vision," leaving no variation in film thickness undetected. In practical applications, it effectively enhances coating uniformity and process stability, providing technical assurance for improving product yield and reducing loss costs.
Measured data indicates that, compared to traditional measurement methods, TDM’s inline metrology solution improves measurement efficiency by over five times while significantly enhancing the comprehensiveness and accuracy of measurement data. This system functions like a "CT scanner" for the production line, making real-time visibility and precise control of every inch of film thickness possible.

3

International Breakthrough: Integration into Leading Overseas Enterprises

Leading overseas solar enterprises impose extremely stringent technical and qualification requirements on suppliers. After undergoing multiple rounds of rigorous testing, the perovskite production line metrology solution developed by TDM successfully passed PDD evaluation and verification, marking its third shipment to this client. This milestone signifies the entry of TDM's inline solution into the mass production phase. The collaboration highlights the first integration of China’s high-end inspection equipment into the supply chain of a top-tier international solar enterprise, demonstrating the global competitiveness of domestically produced inspection systems.

4

Domestic Market Focus: Serving Leading Domestic Clients

In the domestic market, TDM has initiated in-depth collaborations with top-tier enterprises in related industries. A well-known photovoltaic company has integrated TDM’s inline metrology solution into its newly constructed XXX MW perovskite production line. This integration is expected to significantly improve product yield, increase capacity utilization by 30%, and reduce annual loss-related costs by over 10 million RMB.

5

Strategic Layout: New Suzhou Location Facilitates Industrial Synergy

Recently, TDM's Suzhou office officially relocated to the China Suzhou Pioneer Park. This strategic move will further strengthen the company's technological capabilities and market expansion in the field of thin-film metrology. Moving forward, the company will leverage the new Suzhou office as an operational hub to integrate photovoltaic industry resources in the Yangtze River Delta region, providing customers nationwide with higher-quality technical and service support.
Address of the Suzhou Branch: 14F, Building 4, China Suzhou Venture Park

6

Charting the Future Together: Collaborating to Drive Industry Development

The commercialization of perovskite photovoltaic technology still requires close cooperation across the industry chain. TDM cordially invites industry experts and scholars to visit the new office for in-depth exchanges on technology implementation, application scenario innovation, and other areas, jointly exploring new opportunities for the development of the perovskite photovoltaic industry.

Conclusion

With the maturation and widespread adoption of inline metrology technology, the intelligence and precision of perovskite production lines will reach new heights. The innovative solutions provided by TDM not only address current pain points in industrialization but also open up new possibilities for cost reduction and efficiency improvement in perovskite photovoltaics.
Amid the tide of energy transition, technological innovation will always remain the core driving force behind industrial advancement, while advancements in metrologyt technology will continue to pave the way for manufacturing process enhancements.