TDM TECHNOLOGY CO.,LTD.
PVK Inline Metrology Solution SE1000
With SE1000, production engineers gain live visibility into every critical parameter
ThiFilm thicknessckness Absorption Rate, nk Parameters,
Transmittance & Reflectance
Photoluminescence (PL) signals and Bandgap
Dual-Dimensional Data Power
Cross-process benchmarking (compare different production nodes)
Historical trend tracking (analyze same-node performance over time
Transform raw data into actionable insights
1. Unlike contact profilometers that require sample preparation and cause surface damage, SE100's optical measurement technology enables:


Pinpoint equipment/process anomalies with 3D operational analytics

Maintain 24/7 production health monitoring

Enable closed-loop process optimization
From black box to dashboard – where every nanometer speaks its truth.