TDM TECHNOLOGY CO.,LTD.
Inline PL/AOI Metrology Solution SE2000
Revolutionize Your Perovskite Development
Our system delivers inline , in-situ , real-time photoluminescence (PL) data and pinhone detection. Instantly visualize film homogeneity and identify critical defects during processing. Gain immediate insights to optimize production, and ensure superior quality control for higher-performance perovskite modules.
Key Features：
Get PVK PL for multiple points with reach information
Pinholes Detection to show defect of modules
Seamless integration with existing production lines
Shenzhen TDM Technology Co., Ltd.

8th Floor, Unit C039, Meili AAA Commercial Building, No. 428 Jinglong Zhonghuan Road, Longyuan Community, Longhua Street, Longhua District, Shenzhen, China, 518109.
Suzhou TDM Technology Co., Ltd.

Pioneer Park-Building No. 4, ZhuYuan Road 209, HuQiu District, Suzhou, Jiangsu Province, China, 215129.

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