TDM TECHNOLOGY CO.,LTD.
Inline EL/PL mapping metrology solution SE6000
Full-Panel EL/PL Imaging for Smarter Perovskite Production
Uncover every critical detail with our automated EL/PL mapping solution :

Whole-panel imaging – Capture every cm² of perovskite films or finished modules

AI-powered defect classification – Instantly identify:

• Absorption layer irregularities

• Electrode flaws

• Laser scribing defects

• Micro-shorts & current leakage points
Key Benefits
Seamless integration with
existing production lines
Quantitative quality scoring for
every production batch
100% area inspection
vs
traditional sampling