Uncover every critical detail with our
automated EL/PL mapping solution
:
✔
Whole-panel imaging
– Capture every cm² of perovskite films or finished modules
✔
AI-powered defect classification
– Instantly identify:
• Absorption layer irregularities
• Electrode flaws
• Laser scribing defects
• Micro-shorts & current leakage points
Key Benefits
Seamless integration with
existing production lines
Quantitative quality scoring for
every production batch
100% area inspection
vs
traditional sampling