TDM Technology

SE31-FM Wide Band Dual-Use Optical Film Thickness Monitor

Specification
Spectral Range350nm ~ 2400nm (Visible + Near-infrared Full Band)
Measurement ModeTransmission (T) / Reflection (R) Intelligently Auto-switching
Wavelength Resolution< 0.2nm (High-resolution Spectrum Acquisition & Analysis)
System Noise Level± 0.001% (Ensuring Long-term Data Stability)
Monitoring AccuracyFilm thickness accuracy ±0.1% (Based on standard optical film systems)
Communication & ControlRS-232/485, TCP/IP, Analog Output, PLC Integration Supported
Compatible MaterialsSiO₂, MgF₂, Al₂O₃, Ta₂O₅, Nb₂O₅, TiO₂, Si₃N₄, etc.

Core Advantages

  • Ultra-wide Band Global Coverage

  • T/R Dual-mode Intelligent Switching

  • Ultra-high Spectral Resolution

  • Ultra-stable Low-noise Performance

Typical Application

  • Optical coating processes

  • Semiconductor manufacturing

  • Photovoltaic Films

  • Flexible Electronics R&D

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