TDM Technology

Metrology Solutions
for Perovskite Full-Stack Films

To Measure: Thickness & Uniformity, Transmittance, Reflectance, EL/PL Mapping, Single Point PL, AOI, LAB, Roughness, Glass Warpage, Color Difference, Sheet Resistance

Metrology Solutions for Perovskite Full-Stack Films

Inline Production Line Measurement