SE200x Inline PL Mapping and AOI Defect Inspection
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Inline Thin Film Measurement
Production-line measurement systems for in-process thickness and optical metrology, sampling perovskite and multi-layer films at full line speed with no sample preparation — built for closed-loop process control.
Metrology Solutions
for Perovskite Full-Stack Films
To Measure: Thickness & Uniformity, Transmittance, Reflectance, EL/PL Mapping, Single Point PL, AOI, LAB, Roughness, Glass Warpage, Color Difference, Sheet Resistance
Inline Production Line Measurement
How we measure on the production line
These guides cover the optical measurement principles behind TDM inline instruments — film thickness metrology and glass warpage:
- Thin film thickness — definitions, units, test conditions and the published range of every TDM model.
- How to measure thin film thickness — spectral reflectance, ellipsometry, profilometry and 3D imaging compared.
- Optical profilometer guide — roughness, step height and 3D topography — light-section vs WLI/PSI, and when reflectometry or ellipsometry is the better tool.
- Thin film measurement equipment buyer's guide — the three decisions behind any instrument purchase.
- In-line warpage measurement for large glass substrates — phase-deflection warpage, distortion and optical power on conveyor-driven glass lines.