TDM Technology
ProductsContacts

SE600X Inline Perovskite Metrology

The SE600X is a Inline perovskite thickness, PL and T&R from TDM Technology. SE600X inline metrology for perovskite full-stack films: thickness, absorption, reflectance, transmittance and PL (bandgap, peak, FWHM) at 10Hz sampling with 31 measurement points — no sample preparation. It is part of the Inline Production Line Measurement series.

SE600X Inline perovskite thickness, PL and T&R
SE600X Inline perovskite thickness, PL and T&R measurement result 1
SE600X Inline perovskite thickness, PL and T&R measurement result 2

Thickness range

  • 5nm~1200nm

Metrology

  • Thickness

  • Absorption

  • Reflectance

  • Transmittance

  • PL (Bandgap, Peak Intensity, Peak Position, FWHM)

Advantages

  • Sampling 10Hz, no need to prepare the sample

  • Higher safety during handling the sample

  • More points detected (31 vs 11)

More Models in the Same Series