Latest company updates, industry insights and technical sharing articles
What a contact stylus profilometer measures, where it scratches or fails on thin, soft and transparent films, Ra vs Sa, and when to use an optical 3D profilometer instead.
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What a 3D optical profilometer measures — roughness, step height, topography and warp — light-section (SE310) vs WLI/PSI (SE320), and when reflectometry or ellipsometry is the right tool.
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Dual-modal in-situ thickness (5–1200 nm) and PL monitoring of perovskite VCD drying for process control.
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TDM is at PVSEC-37 (WCPEC-9), Booth W-23, Daejeon Convention Center, 15–20 November 2026. See inline, offline and in-situ metrology live.
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TDM SE10 portable PL at PSCO 2026 in Lausanne: rapid perovskite photoluminescence for labs, plus SE60, SE70 and in-situ options.
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TDM's Munich partner JKY Business Solutions exhibited at PSCO 2026, 23–25 September, STCC Lausanne: SE10 portable PL, SE60, SE70, SE100 and SE310.
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Wet-film metrology is a control-loop problem: sampling rate, dead time and mounting geometry decide whether it works — not resolution. SE310 published specs: 15 Hz, 300 nm–20 µm.
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A perovskite stack drifts in more than one dimension. SE600X published outputs — thickness 5–1200 nm, absorption, T/R and PL at 10 Hz over 31 points — separate the causes.
Read MoreSpot size changes what you can isolate, what limits your error, and what repeatability means. SE200 published specs: 1 µm (100X)–100 µm (5X), 3 apertures, ≤0.02 nm repeatability, 4 nm–450 µm.
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