SE20 Defect Mapping Instrument
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Offline Thin Film Measurement
Benchtop instruments for R&D laboratories and production sampling, covering defect mapping, PL/EL imaging, spectral analysis and 3D thickness measurement for photovoltaic, semiconductor and display thin-film applications.
Machine Vision Solution
Spectra Solution
Image-based 3D thickness Solution
How we measure thin film thickness
Every TDM instrument below is built on the same optical measurement principles. These guides explain them in detail:
- Thin film thickness — definitions, units, test conditions and the published range of every TDM model.
- How to measure thin film thickness — spectral reflectance, ellipsometry, profilometry and 3D imaging compared.
- Optical profilometer guide — roughness, step height and 3D topography — light-section vs WLI/PSI, and when reflectometry or ellipsometry is the better tool.
- Thin film measurement equipment buyer's guide — the three decisions behind any instrument purchase.