SE10 Portable PL Metrology Instrument
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SE60 EL/PL & Defect Mapping Instrument
All-in-oneThe SE60 is a EL/PL&Defect Mapping Instrument from TDM Technology. SE60 all-in-one EL/PL and defect mapping for 310×310mm samples. 5K resolution linear PL scan plus area-camera EL, patented AI multi-defect analysis and single-scan misalignment-free imaging. It is part of the Offline Thin Film Measurement series.
Specifications
| Product Model | SE60 |
|---|---|
| Sample Size | 310 mm * 310mm |
| Resolution | 5K |
| Image Format | Original: BMP; Heat Map: jpg |
| Camera | Linear scan camera (PL mapping), Area Camera (EL mapping) |
| Camera Number | 2 |
| Filter Lens | Support |
| PL light source | LED, 450nm (can be customized as required) |
| EL power supply | Constant current or constant voltage mode, 80V/10A; Accuracy: ±0.01V, ±0.001A |
Functionalities
All-in-one EPL functionalities merged together
Patented algorithm: EL mapping, PL mapping and AI-powered multi-defect precision analysis
Single Scan eliminates misalignment and brightness variation
Expert services based on the analysis results
To be customized:
Sample Size (Instrument Size & Camera Number)
Resolution
Machine Learning function (need work with customer for training)
For the principle difference between EL and PL and how to choose between them, see the EL vs PL Inspection Guide.
