SE10 Portable PL Metrology Instrument
View Details
SE100 Multi-functional Thin Film Measurement Instrument
The industry's first PVK full-film metrology instrumentThe SE100 is a Multi-functional Thin Film Measurement Instrument from TDM Technology. SE100 multi-functional thin film measurement instrument for thickness, reflectance, transmittance, n/k, band gap and PL. Sample size 10×10mm to 220×220mm, thickness range 5–1200nm, for semiconductor, photovoltaic and display applications. It is part of the Offline Thin Film Measurement series.
Applications
The SE100 is specified for Semiconductor, Photovoltaic, Display etc.
Thickness range
The specified thickness measurement range of the SE100 is 5-1200 nm.
Specifications
| Product Model | SE100 |
|---|---|
| Size | 337*450*199mm |
| Weight | 12.5kg |
| Functionality | Thickness, Reflectance, Transmittance, n, k, Band gap, PL |
| Accessory | Roughness, Lab, Grid Sampling |
| Scenario | Semiconductor, Photovoltaic, Display etc. |
| Sample Size | 10*10 mm~220*220 mm (Customizable) |
| Sampling | Point |
| Thickness Measurement Range | 5-1200 nm |
| Repeatability | <= ±1% |
| Calculation | <10sec |
| Voltage | 110v-220v |
| Power | 100 w |
