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SE200 Microscopic Thin Film Thickness Measurement Instrument

Precise Micro-area Test · Non-destructive Optical Detection · Multi-scenario Application

The SE200 is a Microscopic Thin Film Thickness Measurement Instrument from TDM Technology. SE200 microscopic film thickness meter with 1µm spot, 380–1000nm spectral range, 4nm–450µm thickness coverage and ≤0.02nm repeatability. Non-contact, C-mount, fits existing microscopes. It is part of the Offline Thin Film Measurement series.

Thickness range

The specified thickness measurement range of the SE200 is 4nm ~ 450μm.

SE200 Microscopic Thin Film Thickness Measurement Instrument
SE200 Microscopic Thin Film Thickness Measurement Instrument measurement result

Specifications

Product ModelSE200
Spectral Range380~1000nm (expandable to 200~1700nm)
Spot Size1μm (100X) ~ 100μm (5X), 3 aperture options
Thickness Range4nm ~ 450μm
AccuracyRepeatability ≤0.02nm; Absolute accuracy 0.2% or 1nm
Sample Compatibility4''~12'' wafers, various sheet samples
Data OutputFilm thickness, n/k values, reflectance spectrum, mapping atlas
InterfaceStandard C-mount for microscope, USB 2.0 for PC connection

Functionalities

  • Precise Micro-area Detection: Adjustable 1μm-100μm spot with CCD visual positioning

  • Sub-nanometer Accuracy: 0.02nm repeatability and better than 0.05nm long-term stability

  • Wide Measuring Range: Covers 4nm to 450μm with UV-Vis-NIR multi-band options

  • Easy Integration & NDT: Standard C-mount interface for existing microscopes; non-contact measurement

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