Pain Points: Limits of Traditional Methods
End-of-line sampling cannot cover 100%; delayed feedback blocks real-time correction and precise defect tracing.

Organic Emissive Material Film: 20 nm – 80 nm, Thickness directly determines luminous efficiency, color coordinates and device lifetime; sub-nm precision control is critical for uniform display image quality.
Amorphous Indium Gallium Zinc Oxide (a-IGZO) Film: 30 nm – 100 nm, Thickness uniformity governs TFT switching characteristics and panel pixel-to-pixel consistency; in-line monitoring directly correlates with production yield.
Indium Tin Oxide (ITO) Film: 20 nm – 150 nm, Thickness balances sheet resistance and optical transmittance; real-time metrology optimizes the trade-off between touch sensitivity and display brightness.
End-of-line sampling cannot cover 100%; delayed feedback blocks real-time correction and precise defect tracing.
Non-contact optical sensing between slot die head and pre-bake enables continuous, non-destructive wet-film inspection in process.
Millisecond feedback enables instant tuning with zero miss risk; pinpoint defects, cut waste, and raise yield and cost efficiency.
In-situ module after the slot die head, linked to MES for millisecond thickness monitoring—stopping coating defects at the source.

Broadband thin-film interferometry captures wet-film optics. Custom hardware and algorithms deliver non-contact, high-precision, real-time monitoring.
Filters stray light in wet-film optics for high SNR and clean signals.
Fits tight line spaces, cuts path loss, boosts vibration immunity.
Tiny spot captures local thickness at micron-level resolution.
Local real-time analysis for ms response and closed-loop control.
Organic emissive films are typically 20–80 nm. Thickness sets luminous efficiency, color coordinates and lifetime; small deviations show up as panel non-uniformity. Sub-nanometer control is required for a uniform display image.
Amorphous IGZO active layers are typically 30–100 nm. Thickness uniformity governs TFT switching and pixel-to-pixel consistency, so in-line monitoring correlates directly with panel yield. End-of-line sampling cannot cover 100% of the glass and is too late for real-time correction.
ITO films in the 20–150 nm range must balance sheet resistance and optical transmittance. Real-time metrology is used to keep touch sensitivity without sacrificing display brightness.
Non-contact optical sensing between the slot-die head and pre-bake inspects wet film continuously. Broadband thin-film interferometry, a compact short optical path, a micron-scale spot and on-edge computing give millisecond thickness feedback into MES so coating defects are stopped at the source.
Tell us your film stack, substrate and production environment. Our application engineers will reply with a measurement method, an instrument configuration — and where our instruments are the wrong choice.
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