Offline Thin Film Measurement
Benchtop laboratory metrology for R&D and sampling.
TDM Product Portfolio
Thin Film Metrology, PV Reliability & Inkjet Printing Equipment
Compare five equipment series by measurement stage: offline laboratory metrology, inline production measurement, in-situ coating monitoring, PV reliability testing, and inkjet printing tools. Select a series using the sample format, required outputs, published measurement range, throughput and integration interface.
- OfflineLaboratory R&D, sampling and mapping
- InlineProduction-line optical and film metrology
- In-situWet-film and optical-film monitoring
- ReliabilityPV I–V, MPPT and light-degradation testing
- InkjetInkjet printing tool for process development
Inline Production Line Measurement
In-line metrology for perovskite full-stack films.
In-situ Real-time Monitoring
SE31 and SE310 monitor film thickness and reflectance from the coating head. SE31-FM provides a separate wide-band transmission/reflection optical-film monitoring route; specifications are model-specific.
Reliability and Durability Test
IEC61215 & IEC61730 reliability and durability test.
Inkjet Printing Tool
Inkjet printing tools for PV, semiconductor, display and electronics. Explore Inkjet Printing Tools
