
Offline Thin Film Measurement
Benchtop laboratory metrology for R&D and sampling.
TDM Product Portfolio
Compare five equipment series by measurement stage: offline laboratory metrology, inline production measurement, in-situ coating monitoring, PV reliability testing, and inkjet printing tools. Select a series using the sample format, required outputs, published measurement range, throughput and integration interface.

Benchtop laboratory metrology for R&D and sampling.

In-line metrology for perovskite full-stack films.

SE31 and SE310 monitor film thickness and reflectance from the coating head. SE31-FM provides a separate wide-band transmission/reflection optical-film monitoring route; specifications are model-specific.

IEC61215 & IEC61730 reliability and durability test.

Inkjet Printing Tools for PV & Renewal Energy, Semi-conductor, Display and Eletronics Industries, Explore Inkjet Printing Tools![]()