Frequently Asked Questions About Thin Film Measurement & Metrology
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FAQ
- Thin film metrology is the measurement and analysis of thin film thickness, optical constants, and layer uniformity. It uses non-destructive optical methods to verify whether a deposited film matches process specifications, so manufacturers can control coating quality and yield without damaging the sample.
- TDM Technology uses Offline, Inline and In-situ as its standard configuration terms. Offline inspection measures sampled substrates on benchtop equipment in a laboratory, typically for R&D and incoming material checks. Inline inspection uses a measurement station integrated into the production line. In-situ inspection monitors the film at the active coating process. TDM Technology provides SE31/SE310 coating-head wet-film monitoring and SE31-FM wide-band transmission/reflection optical-film monitoring.
- TDM Technology thin film metrology equipment is used in the photovoltaic industry, semiconductor wafer manufacturing, display panels, consumer electronics, food and pharmaceutical packaging, and precision optical components. Any process that deposits a functional coating and needs thickness or uniformity control can apply it.
- Published outputs depend on the model. SE100 reports thickness, reflectance, transmittance, n, k, band gap and PL; SE200 reports micro-area thickness, n/k, reflectance spectrum and mapping; SE600X combines inline thickness, absorption, T/R and PL; SE31/SE310 monitor wet-film thickness and reflectance; and SE31-FM provides wide-band T/R optical-film monitoring.
- Yes. TDM Technology provides custom measurement and control systems designed around a specific process, including equipment selection, production line integration, measurement software, on-site calibration, and lifetime after-sales technical support. Free on-site production line surveys and free sample testing are available before the scheme is finalized.
- Start with the film stack, substrate, expected thickness range, sample dimensions, required spot size, measurement outputs, cycle time and integration interface. Then decide whether measurement is needed Offline in a laboratory, Inline at a production station or In-situ during the active coating process. Match these requirements to one model's published specifications rather than transferring ranges or accuracy claims between products.
- Published numerical ranges are model-specific: SE100 covers 5–1200 nm, SE200 covers 4 nm–450 µm, SE600X covers 5–1200 nm and SE310 covers 300 nm–20 µm for slot-die wet films. SE31 and SE8000 do not publish numerical thickness ranges. SE31-FM publishes spectral coverage and accuracy conditions rather than a universal thickness range.
- Selected models support these tasks. SE8000 publishes imaging 3D thickness, multilayer film metrology and uniformity visualization, while SE200 publishes micro-area film thickness, n/k, reflectance spectra and a mapping atlas. The suitable model still depends on the layer stack, materials, sample size and required spatial resolution; SE8000 does not publish a numerical thickness range.
- The published Reliability portfolio separates these roles: SE920 supports steady-state I–V and degradation testing, SE400 supports MPPT testing under a classified illumination environment, and SE910 supports PV module light-degradation testing. The public data does not support treating one model as an all-in-one platform, and some electrical acquisition details remain unpublished.
- No. IEC 61215 addresses terrestrial PV module design qualification and type approval, while IEC 61730 addresses PV module safety qualification. A product page listing either standard provides test-context information; it does not by itself prove equipment certification, laboratory accreditation or complete coverage of every required test sequence. Confirm the selected model's scope and any required third-party certification separately.