Full Scenario Coverage
Covers offline laboratory equipment, online production line integration, and in-situ vacuum chamber monitoring. Meets detection needs for the entire thin film process.
In-situ Real-time Coating Monitoring System for PV Production Lines
In-situ close-loop control for Perovskite and Coated Battery Cells production processes
In-situ EquipmentAbout TDM · Professional R&D Team
TDM Technology Co., Ltd., based in Suzhou Industrial Park, specializes in high-precision thin film measurement equipment. Guided by first-principles thinking, we pioneer non-destructive testing technologies to break technical barriers. We provide comprehensive offline, online, and in-situ inspection solutions for strategic industries like photovoltaics, semiconductors, and advanced displays.
Core R&D Team: Composed of senior physicists and optical engineers with backgrounds from CAS, Huawei, and overseas labs. With 20 years of experience, we cover the full spectrum from material R&D and prototyping to mass production deployment.
Leveraging deep expertise in physics and optics, TDM delivers stable, high-precision, closed-loop measurement solutions for the new energy, semiconductor, and display industries. We drive technological innovation to enhance quality, yield, and intelligent manufacturing for our partners.
10+
Self-owned Patents
3 Years
R&D Experience
50%
R&D Personnel
50+
Partner Enterprises
Core Advantages
Multi-Industry Adaptability
Versatile for PV, semiconductor, display panels, optical coatings, and new energy. Supports multi-layer composite films, metal/dielectric/ITO layer detection.
Self-Developed Core Technology
Utilizes spectroscopic ellipsometry, optical interference, XRF, and laser reflectometry algorithms. Nanometer level high-precision non-destructive testing system.
One-Stop Service
Complete set of services including equipment, line integration, software, on-site calibration, and lifetime after-sales technical support.
Four Major Series of Measurement Equipment
Offline Thin Film Measurement
Benchtop laboratory metrology for R&D and sampling.
Inline Production Line Measurement
In-line metrology for perovskite full-stack films.
In-situ Real-time Monitoring
Modular in-situ thickness/PL/reflectance monitoring.
Reliability & Electrical Safety
IEC61215 & IEC61730 reliability and safety solutions.
Full Industry Chain Solutions for Thin Film Coatings
R&D and Technical Strength
- 10+ Self-developed thin film measurement patents
- Nanometer-level detection accuracy up to ≤1nm
- Serving 100+ domestic and international thin film enterprises
- Supports synchronous detection of 20+ types of thin film materials
User Evaluation
From Customer
Ethan
PM, California-based Enterprise
Great balance between cost and functionality. We are planning to expand the deployment across more production lines.
From Customer
David
CMO, California-based Enterprise
We have deployed this defect mapping instrument on our pilot production line for months. It delivers stable testing results with consistent accuracy.
From Customer
Janice
IPMP, Singapore-based Enterprise
Our team was looking for cost-effective inspection equipment to replace our old testing solution. SE20 fulfills most of our core detection demands.
From Customer
Michael
CTO, Germany-based Enterprise
The measurement accuracy is impressive. Integration into our coating line was smooth and support response has been timely.
From Customer
Ryan
Plant Manager, Malaysia-based Enterprise
From sample testing to on-site commissioning, TDM provided a complete solution that met our production requirements.
Get Advanced Thin Film Metrology Solutions
Free on-site production line survey- Free sample testing experiments
- Customized equipment scheme design