One Instrument, One Scan: SE69 Hyperspectral EL/PL Defect Mapping
One instrument. One scan. Every defect, every uniformity gap — and every pixel carries a complete emission spectrum. In perovskite thin film R&D and pilot production, single-point PL/EL can look strong while full-device performance still falls short. SE69 closes that visibility gap with full-field hyperspectral EL/PL mapping.
The uniformity wall in perovskite R&D
In perovskite thin film R&D and pilot production, there's a wall almost everyone hits eventually: single-point PL/EL measurements look great on paper, but full device performance never quite matches up. We know uniformity is capping yield. What we don't know is where it is breaking down — compositional drift, poor crystallization, interface leakage, or micro-defects hidden beneath a measurement that only samples one point at a time.
Here's the uncomfortable truth: you can't optimize what you can't fully see.
That's the gap the SE69 Hyperspectral EL/PL & Defect Mapping Instrument was designed to close. Purpose-designed for perovskite (PVK) thin film characterization, it replaces single-point sampling with full-field hyperspectral imaging — every pixel across the sample carries its own complete emission spectrum.
The result: spatial mapping, spectral analysis, and quantitative quality control — all in a single non-destructive scan. No more guessing which defect mechanism is dragging down your yield. See it, localize it, fix it.
Core capability: dual EL + PL mapping
Why choose between characterizing your material and validating your device? The SE69 does both.
- PL mode reveals the intrinsic luminescent quality of the material itself.
- EL mode shows how the device actually behaves under real electrical drive.
Cross-referencing the two lets you isolate root causes fast — pinpointing whether the issue sits in the absorber layer, the crystallization quality, or the electrode/interface contact. For the principle difference between EL and PL, see our EL vs PL Inspection guide.
Full-surface parameter mapping in one scan
One scan is all it takes. The SE69 generates full spatial distribution maps of PL intensity, FWHM and band gap across the entire sample simultaneously.
No more tedious point-by-point testing. No more averaged data quietly hiding the uniformity gaps that matter most.
Spectrally resolved defect analysis
Move beyond basic grayscale imaging. The SE69 pinpoints defects with exact coordinate localization and goes further — identifying what kind of defect you are looking at directly from its spectral fingerprint.
No more guessing why a dark spot appears.
Key specifications optimized for PVK thin films
| Parameter | Published value |
|---|---|
| Scan area | 100 × 100 mm (lab samples and pilot-scale coupons) |
| Resolution | 0.1 mm/pixel (micro-defects, pinholes and grain-level variations) |
| Camera | Hyperspectral camera — full spectral data at every spatial position, not just intensity |
What the outputs tell you
- Full-view luminescence image with precise defect coordinates, paired with the corresponding emission spectrum — definitive root-cause identification in a single view.
- Grayscale intensity map for instant, at-a-glance assessment of full-film uniformity.
- Multi-point emission spectra overlay for quantitative comparison of compositional and crystalline homogeneity across the sample.
See the full field. Localize the defect. Fix the root cause.
Don't let single-point measurements hide the uniformity gaps that cap your yield. SE69 gives you full-field visibility in one non-destructive scan: every pixel carries its own complete emission spectrum, so you can localize defects precisely, identify root causes from spectral fingerprints, and fix yield limiters faster.
Explore the SE69 Hyperspectral EL/PL & Defect Mapping Instrument, review related PV electroluminescence testing, or contact TDM to explore how SE69 can accelerate your perovskite roadmap.
Frequently asked questions
How is SE69 different from single-point PL/EL?
Single-point PL/EL samples one location at a time and can miss uniformity gaps. SE69 captures a full-field hyperspectral map so every pixel carries a complete emission spectrum in one non-destructive scan.
Does SE69 support both EL and PL?
Yes. PL characterizes intrinsic material luminescence; EL shows device behavior under electrical drive. Cross-referencing both helps isolate absorber, crystallization and interface issues.
What scan area and resolution does SE69 publish?
Published SE69 specifications include a 100 × 100 mm scan area at 0.1 mm/pixel with a hyperspectral camera for perovskite thin film work.
Can SE69 identify defect type, not just location?
SE69 localizes defects by coordinates and uses spectral fingerprints to go beyond grayscale dark spots, supporting root-cause identification from the emission spectrum.
Related guides and products
- EL vs PL Inspection Guide
- AOI Solar Cell Defect Detection Guide
- SE69 Hyperspectral EL/PL & Defect Mapping Instrument
- PV Electroluminescence Testing
- Contact TDM
