PV Electroluminescence Testing and Defect Mapping
TDM's published EL-capable portfolio currently consists of offline EL/PL, AOI and mapping instruments: SE60, SE68, SE69 and SE80. Their public specifications cover sample areas from 20 × 20 mm to 310 × 310 mm. This page separates those product capabilities from the scope of IEC TS 60904-13, IEC 61215 and IEC 61730.
Published EL-Capable TDM Products
| Model | Published role | Published specifications | Boundary |
|---|---|---|---|
| SE60 | Offline EL/PL and defect mapping | 310 × 310 mm samples; 5K; area-camera EL plus linear-scan PL; EL supply 80 V/10 A with ±0.01 V and ±0.001 A accuracy | Machine-learning functions require customer training; no IEC conformity, cycle time or full-size module throughput is published |
| SE68 | Offline EPL mapping, AOI and degradation integration | 310 × 310 mm samples; 5K; area-camera EL/AOI plus linear-scan PL; 380–900 nm degradation source; 200–1100 W/m² | The public page does not publish IEC conformity, EL acquisition time or production-line throughput |
| SE69 | Hyperspectral EL/PL and defect mapping for PVK films | 100 × 100 mm scan area; 0.1 mm/pixel; hyperspectral camera; PL intensity/FWHM/band-gap, EL and BL mapping | The published target is PVK thin film; module-level IEC workflow and throughput are not published |
| SE80 | High-resolution AOI and EPL mapping for PVK films | 20 × 20 mm scan area; 3.15 µm/pixel; one Sony ILCR-7RM5 camera; AOI/EPL defect comparison | Sample size and resolution can be customized; machine learning requires customer training; no IEC conformity is published |
The public portfolio does not currently identify an inline, full-size PV-module EL system with a published cycle time. Such a configuration should therefore be confirmed separately rather than inferred from the offline models.
How EL Image Acquisition Works
Forward-Bias Excitation
The photovoltaic device is driven in forward bias so radiative recombination produces an EL signal. The applied current, voltage, settling time and contact method are part of the test condition and must be recorded.
Controlled Image Capture
Camera response, optics, exposure, focus, ambient-light control and sample position affect image comparability. SE60 and SE68 publish area-camera EL configurations; SE69 publishes a hyperspectral camera.
Processing and Interpretation
Image correction, quantitative metrics and defect interpretation require a defined procedure. SE60 publishes AI-powered defect analysis, while its machine-learning customization requires customer data and training.
What EL Image Features Can Indicate
EL images show emission non-uniformity; a dark feature is evidence for investigation, not a complete root-cause diagnosis by itself. Correlate image features with electrical, process and visual data.
| Observed feature | Possible interpretation |
|---|---|
| Dark line or inactive region | Interrupted current path, crack or electrically isolated area |
| Dark finger or stripe | Metallization or interconnection discontinuity |
| Localized dark spot | Shunt, contamination or locally reduced electroluminescence |
| Non-uniform brightness | Electrical or material non-uniformity requiring correlation with process data |
IEC Standard Scope and Claim Boundaries
Use the complete designation and distinguish a Technical Specification from an International Standard. Referencing a document describes the intended workflow; it does not certify a product or prove that one instrument covers every clause.
| Document | Publication type | Scope | Claim boundary |
|---|---|---|---|
| IEC TS 60904-13:2018 Photovoltaic devices — Part 13: Electroluminescence of photovoltaic modules | Technical Specification | Methods to capture EL images of forward-biased PV modules, process images into quantitative metrics and interpret observed image features | Defines EL image capture, processing and interpretation methods; it is not an equipment certification and does not establish complete IEC 61215 or IEC 61730 coverage. |
| IEC 60904-1:2020 Photovoltaic devices — Part 1: Measurement of photovoltaic current-voltage characteristics | International Standard | Procedures for measuring I–V curves of PV cells, sub-assemblies and modules under natural or simulated sunlight | Covers photovoltaic I–V measurement procedures, not EL image acquisition. |
| IEC 61215 series Terrestrial photovoltaic modules — Design qualification and type approval | International Standard | Design-qualification requirements and test procedures for terrestrial PV modules intended for long-term outdoor operation | Covers module design qualification and type approval. An EL image or one listed product function does not demonstrate completion of the full test sequence. |
| IEC 61730 series Photovoltaic module safety qualification | International Standard | Construction requirements and test procedures addressing electrical shock, fire and personal-injury risks | Covers module safety qualification. EL imaging alone does not demonstrate construction compliance or completion of required safety tests. |
Conditions to Confirm for an EL Configuration
- Device type, active area, sample dimensions and fixture.
- Forward-bias current/voltage range, accuracy and stability.
- Camera spectral response, pixel resolution, optics and field of view.
- Dark-enclosure, exposure, focus and ambient-light conditions.
- Image correction, reference image and quantitative metrics.
- Defect taxonomy, acceptance threshold and validation samples.
- Repeat count, cycle time, raw-image format and report output.
- Exact IEC document, edition, clause and test-workflow role.
Frequently Asked Questions
What is electroluminescence testing for photovoltaic devices?
EL testing places a photovoltaic device under forward bias and captures the emitted image. Reduced or non-uniform emission can reveal features associated with interrupted current paths, metallization defects, cracks or inactive regions. Interpretation should use controlled acquisition conditions and validated defect criteria.
Which current TDM products publish EL functionality?
SE60 publishes EL/PL and defect mapping for 310 × 310 mm samples; SE68 combines EPL mapping, AOI and degradation testing at the same published sample size; SE69 provides hyperspectral EL/PL mapping over 100 × 100 mm; and SE80 provides high-resolution AOI/EPL mapping over 20 × 20 mm.
What does IEC TS 60904-13:2018 cover?
IEC TS 60904-13:2018 is an IEC Technical Specification for capturing electroluminescence images of forward-biased PV modules, processing images into quantitative metrics and qualitatively interpreting observed image features.
Does EL capability mean a system is IEC 61215 or IEC 61730 certified?
No. IEC 61215 addresses terrestrial PV module design qualification and type approval, while IEC 61730 addresses module safety qualification. EL imaging can support a defined test workflow, but EL capability or a standards reference does not by itself establish equipment certification or full-sequence conformity.
How is the EL standard different from the I–V standard?
IEC TS 60904-13 addresses EL image capture, processing and interpretation. IEC 60904-1 addresses measurement of photovoltaic current-voltage characteristics. They are separate procedures and require separate equipment specifications and test conditions.
