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SE69 Hyperspectral EL/PL & Defect Mapping Instrument

Hyperspectral Camera

The SE69 is a Hyperspectral EL/PL&Defect Mapping Instrument from TDM Technology. SE69 hyperspectral EL/PL and defect mapping instrument for PVK thin films. 100×100mm scan area at 0.1 mm/pixel with a hyperspectral camera. It is part of the Offline Thin Film Measurement series.

SE69 Hyperspectral EL/PL&Defect Mapping Instrument

Specifications

Product ModelSE69
Scan area100 * 100 mm
TargetPVK Thin Film
Resolution0.1 mm/pixel
CameraHyperspectral Camera

Functionalities

  • Mapping of PL, Intensity, FWHM, and Bandgap across the Entire Sample Surface

  • EL mapping

  • BL mapping

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