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SE20 Defect Mapping Instrument

10% Cost v.s. 90% Features

The SE20 is a Defect Mapping Instrument from TDM Technology. SE20 defect mapping instrument detects micro-cracks, broken grids and dark spots at 60µm/pixel over 250×250mm. Automated screening, statistical analysis and ML-ready defect classification for PV cell and module inspection. It is part of the Offline Thin Film Measurement series.

SE20 Defect Mapping Instrument
SE20 Defect Mapping Instrument measurement result

Specifications

Product ModelSE20
Resolution60μm/pixel
Detection area250×250mm

Functionalities

  • Statistical analysis function for different sizes

  • Automated defect screening based on process-validated criteria

To be customized:

  • Resolution: up to 5μm/pixel

  • Detection Area: up to 2400 * 1600 mm (with more cameras)

  • Machine Learning: To detect different shapes of defects (need work with customer for training)

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