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SE8000 Imaging 3D Thin-Film Thickness Measuring Instrument

Imaging-based 3D thickness measuring instrument

The SE8000 is a Imaging 3D Thin-Film Thickness Measuring Instrument from TDM Technology. SE8000 imaging-based 3D thickness measurement with ultra-high micro-area resolution, multi-layer film metrology, uniformity visualization and full-range continuous spectrum collection. It is part of the Offline Thin Film Measurement series.

SE8000 Imaging 3D Thin-Film Thickness Measuring Instrument

Functionalities

  • Ultra-high Micro-area Resolution

  • Intelligent Reference Image Identification

  • Full-range Continuous Spectrum Collection

  • Multi-layer Film Thickness metrology

  • Film Uniformity Visualization

  • Auto Measurement at Preset Positions

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