SE600X Inline perovskite thickness, PL and T&R
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SE200x Inline PL Mapping and AOI Defect Inspection
The SE200x is a Inline PL Mapping and AOI Defect Inspection from TDM Technology. SE200x inline PL mapping and AOI defect inspection system for production-line thin-film quality control. It is part of the Inline Production Line Measurement series.
Camera
Linear Camera
Highest Resolution
3μm/Pixel
Metrology
PL Mapping
AOI
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