SE200x Inline PL Mapping and AOI Defect Inspection
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SE3000 Glass Warpage Measurement System
Inline full-area noncontact glass warpage, distortion and optical power measurementThe SE3000 is a Glass Warpage Measurement System from TDM Technology. SE3000 glass warpage measurement system: inline full-area noncontact warpage, distortion and optical power for PV and architectural glass up to 2400×1200 mm. It is part of the Inline Production Line Measurement series.
Specifications
| Product Model | SE3000 |
|---|---|
| Product Name | Glass Warpage Measurement System |
| Glass Size | Minimum 300 × 300 mm; maximum 2400 × 1200 mm (custom expansion available) |
| Glass Thickness | 0.5–5 mm |
| Production Line Speed | ≤30 m/min |
| Equipment Dimensions | 1800 × 1200 × 1600 mm (main unit) |
| Equipment Weight | Approx. 450 kg |
| Installation Height | Adjustable: scanning plane 300–500 mm above the glass surface |
| Warpage Measurement Range | 0–2000 μm |
| Warpage Measurement Accuracy | ≤±10 μm |
| Warpage Measurement Repeatability | ≤0.5 μm (1σ) |
| Distortion Measurement Accuracy | ≤±5 mD |
| Recognized Distortion Types | ≥8: roller wave, edge kink, picture framing, pocket, hammer, bi-stability, saddle bow, corner lift |
| Inspection Time per Sheet | ≤60 s |
| Inspection Coverage | 100% of the glass surface |
| Cameras | 2 × 5 MP industrial cameras or 1 × 12 MP global-shutter camera; GigE interface |
| Light Source / Projection | Custom LED structured-light projection module with stable wavelength and resistance to ambient-light interference |
| Electromagnetic Compatibility | Complies with GB/T 18268.1 |
Functionalities
Inline full-area noncontact glass warpage measurement
Optical distortion and optical power measurement
Structured-light circular pattern projection with reflection imaging
Simultaneous multi-parameter calculation without reference plane
Transmitted optical power and glass thickness calculation (without external thickness sensor)
To be customized:
Glass size custom expansion beyond 2400 x 1200 mm
Camera configuration (2 x 5 MP or 1 x 12 MP)
Advantages
Full-area coverage (100% of glass surface)
No reference plane required
Simultaneous calculation of multiple parameters
Suitable for real-time QC on PV and architectural glass production lines
