EL/PL&Defect Mapping Instrument

All-in-one

Specification

Product Model	SE60
Sample Size	310 mm * 310mm
Resolution	5K
Image Format	Original: BMP; Heat Map: jpg
Camera	Linear scan camera (PL mapping), Area Camera (EL mapping)
Camera Number	2
Filter Lens	Support
PL light source	LED, 450nm (can be customized as required)
EL power supply	Constant current or constant voltage mode, 80V/10A; Accuracy: ±0.01V, ±0.001A

Functionalities

All-in-one EPL functionalities merged together
Patented algorithm: EL mapping, PL mapping and AI-powered multi-defect precision analysis
Single Scan eliminates misalignment and brightness variation
Expert services based on the analysis results