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Multi-functional Thin Film Measurement Instrument

The industry's first PVK full-film metrology instrument
SE100
SE100 effect
Specification
Product ModelSE100
Size337*450*199mm
Weight12.5kg
FunctionalityThickness, Reflectance, Transmittance, n, k, Band gap, PL
AccessoryRoughness, Lab, Grid Sampling
ScenarioSemiconductor, Photovoltaic, Display etc.
Sample Size10*10 mm~220*220 mm (Customizable)
SamplingPoint
Thickness Measurement Range5-1200 nm
Repeatability<= ±1%
Calculation<10sec
Voltage110v-220v
Power100 w

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