SE10
View Details
Defect Mapping Instrument
10% Cost v.s. 90% Features
Specification
| Product Model | SE20 |
|---|---|
| Resolution | 60μm/pixel |
| Detection area | 250×250mm |
Functionalities
Statistical analysis function for different sizes
Automated defect screening based on process-validated criteria
To be customized:
Resolution: up to 5μm/pixel
Detection Area: up to 2400 * 1600 mm (with more cameras)
Machine Learning: To detect different shapes of defects (need work with customer for training)
