
Hyperspectral EL/PL&Defect Mapping Instrument

Specification
| Product Model | SE69 |
|---|---|
| Scan area | 100 * 100 mm |
| Target | PVK Thin Film |
| Resolution | 0.1 mm/pixel |
| Camera | Hyperspectral Camera |
Functionalities

Mapping of PL, Intensity, FWHM, and Bandgap across the Entire Sample Surface

EL mapping

BL mapping



